E6607C 回收二手 E6607C
| 參考價 | ￥ 8900 |
| 訂貨量 | ≥1 |
- 公司名稱 東莞市塘廈金泰電子儀器經營部
- 品牌
- 型號 E6607C
- 產地 美國
- 廠商性質 其他
- 更新時間 2017/5/29 11:17:34
- 訪問次數 221
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電子測試儀器: 網絡分析儀、頻譜分析儀、無線綜合測試儀、藍牙測試儀、高低頻信號源、電子負載、數字存儲示波器、信號發(fā)生器、函數信號發(fā)生器、標準信號源、頻率計、數字萬用表、LCR數字電橋、無線綜合測試儀、直流穩(wěn)壓電源、手機程控電源、電容測量儀、電感測量儀、掃頻信號發(fā)生器、電話分析儀、示波器校準儀、耐壓測試儀,絕緣電阻測試儀、接地電阻測試儀、泄漏電流測試儀、電參數測試儀、數字功率計、PCI-GPIB卡等。
E6607C
回收:謝: (同號)
咨詢 :
東莞市金泰電子儀器（回收）有限公司
二手/主營品牌：安捷倫、美國泰克、美國福祿克、美國吉時利、艾法斯、日本菊水、北京普源、中國臺灣固緯、德國惠美、摩托羅拉、美國力科、美國韋夫特克、德國羅德施瓦茨、英國馬可尼、英國施倫伯杰、日本安立(安利)、日本愛德萬、等。
*銷售/回收儀器儀表，回收倒閉工廠儀器儀表，個人閑置儀器/等.世界產品、不論多少,不分好壞、咨詢！
地址：廣東省東莞市塘廈鎮(zhèn)塘廈大道18號
主要特性與技術指標
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing
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